ECE 5961 Practical Scanning Electron Microscopy
Cross listed with PHYS 5739 and MetE 7910
Students learn multiple advanced microscopy applications using state-of-the art imaging tools and analytical peripherals (EDS, EBSD, XRF).
ECE 7960 Surface Chemistry & Analysis
Cross listed as CHEM 7780 and MET E 7910
Introduction to physics and chemistry of solid surfaces. The lab section of the course is designed to provide a working knowledge for the operation of the Kratos Axis Ultra XPS/AES/ISS surface analysis system.
The Surface Analysis Lab regularly offers a 6-week Scanning Electron Microscopy and Microanalysis short course. This covers the basic of electron microscopy with emphasis on techniques on secondary and backscattered electron imaging. Supplementary courses on elemental analysis via energy dispersive x-ray (EDS) and crystal orientation analysis via electron backscatter diffraction (EBSD) are also offered. An introduction to ultra-high resolution SEM using the Helios focused ion beam is also included. This short course is offered during summer (May – June).
We also conduct a short course for Scanning/Transmission Electron Microscopy in our JEOL 2800 S/TEM. This consists of 7-week lecture and lab classes that cover fundamental concepts on TEM and S/TEM mode bright field and dark field imaging, electron diffraction (selected area, nanobeam, and convergent beam modes), energy dispersive x-ray spectroscopy, and tomography (STEM and EDS modes). This short course is offered in spring (January – February) and fall (September – October) semesters.
One-on-one training for most instruments are also offered by the Surface Analysis Lab. Contact us for information regarding instrument trainings.