JEOL JEM-2800 Scanning Transmission Electron Microscope (S/TEM)

The Jeol JEM 2800 outside its housing


The JEM-2800 is a high throughput nano-analysis TEM with automated functions

Operation Modes:
•   TEM
•   STEM
•   SEM imaging capabilities

Electron Gun
•   Schottky-Type Electron Gun
•   Accelerating voltage: 100kV-200kV

•   Energy-Dispersive X-ray Spectrometer
•   Dual Detector



When publishing work with data collected from the S/TEM, the following should be used for acknowledgment: 

“This work made use of University of Utah USTAR shared facilities support, in part, by the MRSEC Program of NSF under Award No. DMR-1121252.”

S/TEM Features and Applications

Bright field TEM image of Cobalt nanoparticles embedded into a graphene matrix

Magnification (on 24-inch wide LCD)

•   SEM (Mag) 100 to 150,000,000x
•   STEM (Mag) 100 to 150,000,000x
•   TEM (Mag) 500 to 20,000,000x






Bright Field and Multiple Dark Field imaging modes on TEM

Bright Field (left) and Dark Field (right) TEM images of polycrystalline Aluminum deposited on TEM grid highlights different crystalline faces


Nanometer-scale resolution on EDS mapping with the use of the Dual x-ray detectors
Dave Cullen

Pt3Ni Nanoclusters from Dave Cullen, Oak Ridge National Laboratory (ORNL)

Elemental mappint

Elemental mapping of Pt and Ni on a single cage showing nanoscale resolution of EDS





PtNi Fuel cell catalysts. Sample provided by David Cullen, Oak Ridge National Laboratory High angle dark field (top row), Secondary electron images (bottom row).


Hi-res Imaging and Diffraction of Reference Silicon Samples
Si diffraction

(Left to Right): Hi-res TEM image of Si(110); Kikuchi bands obtained on Si(111); and Convergent Beam Diffraction (CBD) pattern on Si(111)

Calibration sample provided by the JEOL service engineer.  Shown are the silicon lattice and then an even  high resolution image showing the dumbbell structure of the lattice.  Literature values for the dumbbell  separation are  136 pm (.136 nm 1.36 A).

 Specimen Stage

•   Eucentric side-entry goniometer stage
•   Specimen size: 3 mm Diameter
•   Y Tilt Angle: +/- 30°; X Tilt Angle:  +/-  25°
•   Movement Range X,Y: +/-1.0mm Z: +/-0.2 mm•   X Tilt Angle:  +/-  25°

On-going Projects
Characterization of transition metal components on MgH2 nanoparticles:
Zak Fang Group, Metallurgical Engineering

(L-R): Low magnification TEM image of MgH2 nanoparticles showing localization of transition metal composites (dark spots); (2nd and 3rd) high-resolution TEM image of the dark areas showing lattice spacing of the nanocrystallites: and high resolution EDS map of a nanoparticle showing concentrations of Cr.

Characterization of Titania Nanotubes:
Mano Misra Group, Metallurgical Engineering

(L-R): Bright FIeld (BF); Dark Field (DF); and Secondary Electron Image (SEI) of Titania nanotubes showing morphology of the inner walls and the surface (SEI). Scale bar is at 20 nm.

low DF

A series of intermediate magnification TEM images on Titania nanotubes


Left to Right: (1st and 2nd) BF and DF TEM images of Titania nanotubes. DF image highlights localization of the (101) lattice planes. (3rd) Hi-resolution TEM image shows lattice spacings on TiO2

Characterization of Carbon Nanotubes:
Michael Granger Group, Nano Institute of Utah
CNT Falconer

Low resolution and High resolution images of clusters of carbon nanotubes

Characterization of Au-Pd nanoparticles:
Art Quast, Jennifer Shumaker-Parry Group, Department of Chemistry
Art Quast Au Nanoparticles

(L-R) STEM Bright field image of clusters of Au-Pd nanoparticles; corresponding STEM Dark Field image of the same area showing better contrast of the nanoparticles; and Hi-resolution TEM image


EDS Analysis of Fe/SiO2 Core-Shell nanoparticles for Applications on Drug Delivery:
Marc Porter Group, Nano Institute of Utah

These nanoparticles are interesting due to their magnetic properties which can be used for targeted drug delivery. High resolution STEM-EDS allow us to identify thickness of the SiO2 shell and even the intermediate S layer between the shell and the core. Click image to view article on this research.

Characterization of Bi2S3 Nanorods:
Luisa Whittaker-Brooks Group, Department of Chemistry

(L-R): Low res image of Bi2S3 nanorods; Elemental map using EDS; Hi-res image showing lattice planes; and diffraction pattern obtained from the nanorods.

Recent Publication

1.      Saji, Kachirayil J., Kun Tian, Michael Snure, and Ashutosh Tiwari. 2D Tin Monoxide—An Unexplored p‐Type van der Waals Semiconductor: Material Characteristics and Field Effect Transistors, Adv. Electron. Mater., 2016. DOI: 10.1002/aelm.201500453

2.     Smith, Y. R., Bhattacharyya, D., Mohanty, S. K., & Misra, M. Anodic Functionalization of Titania Nanotube Arrays for the Electrochemical Detection of Tuberculosis Biomarker Vapors, J. Electrochem. Soc., 2016163, B83-B89.

3.     You, Bo, and Yujie Sun. Chalcogenide and Phosphide Solid‐State Electrocatalysts for Hydrogen Generation. ChemPlusChem, 2016, 81, 1 – 12.

4.     Zhou, C., Zak Fang, Z., Bowman, R.C.Jr., Xia, Y., Lu, J., Luo, X., and Ren, Y., Stability of Catalyzed Magnesium Hydride Nanocrystalline During Hydrogen Cycling. Part II: Microstructure EvolutionJ. Phys. Chem. C, 2015, 119, 22272–22280.

5.   You, B., Jiang, N., Sheng, M., Drisdell, W.S., Yano, J., and Sun, Y., Bimetal-Organic Framework Self-Adjusted Synthesis of SupportFree Nonprecious Electrocatalysts for Efficient Oxygen ReductionACS Catal. 2015, 5, 7068−7076.

6.   Park, J., Porter, M.D., and Michael C. Granger, M.C., Silica Encapsulation of Ferrimagnetic Zinc Ferrite Nanocubes Enabled by Layer-by-Layer Polyelectrolyte Deposition,  Langmuir, 2015, 31, 3537–3545.

Hourly Rate

On Campus Users:                            $   50.00
Off Campus Users:                            $   75.50
Industry Users:                                  $ 100.00

Experimental Run Rate:

On Campus Users:                            $   200.00
Off Campus Users:                            $   302.00
Industry Users:                                  $ 400.00

For tech support rates see please see our complete billing rates.

Contact Us for more information:
Brian Van Devener

Paulo Perez

Lab:      801-587-3108
Office:   801-581-6855

Randy Polson

Office: 801-587-0873