Atomic Force Microscope (AFM): Bruker Dimension Icon |
Ellipsometer: Woollam Variable Angle Scanning Ellipsometer (VASE) |
Focused Ion Beam (FIB) Scanning Electron Microscope (SEM): FEI Helios Nanolab 650 |
Laser Confocal Microscope: Olympus LEXT OLS5000 |
Nanoindenter: Hysitron TI Premier |
Optical Comparator: Vertex 220 |
Optical Profiler: Zygo NewView5000 |
Scanning Electron Microscope (SEM): FEI Quanta 600FEG |
Scanning Transmission Electron Microscope (STEM): JEOL 2800 |
X-ray Fluorescence Spectrometer (XRF): Eagle III Microspot |
X-ray Photoelectron Spectrophotometer (XPS): Kratos Axis Ultra |