Zygo NewView 5000 Optical Profilometer

The ZygoNewView 5000 quantitatively measures the surface topography of a sample. The instrument is based on phase shifting interferometry and determines sample height and roughness from the changes in the white light interference pattern.

Measuring Range

  • 150 μm vertical range with Angstrom resolution
  • 5 mm vertical range with nanometer resolution
  • Lateral resolution: 0.9 μm for 20X objective
  • Field of View:
    • 350 x 260 μm2 with 20X objective
    • 3 x 3 mm2 with the 5X objective

Uses and Applications

  • Surface roughness
  • MEMS inspection and characterization
  • Etch inspection
  • Failure analysis of metallurgical samples
  • Thin film characterization

On Campus Users: $25.00 Dr. Paulo Perez
Off Campus Academic Users $38.00 Lab: 801-587-3108
Industry Rate $50.00 Office: 801-581-6855
Industry Expedite Rate $150.00

Selected Publications

Sanders, A.P., P. Dudhiya, and Brannon, R.M.
Thin Hard Crest on the Edge of Ceramic Acetabular Liners Accelerates Wear in Edge Loading,
J. Arthroplasticy, 2011, 27, 150 – 152.
Bamberg, E., and Rakwal, D.
Experimental Investigation of Wire Electrical Discharge Machining of Gallium-Doped Germanium
J. Mater. Process. Technol., 2008, 197, 419-427.

To see more of our publications click here.